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The extended-I/O-measurement-block facility may be available on models implementing z/Architecture. The facility includes the following features:
A new format of the channel-measurement block. The new measurement block, termed a format-1 channel-measurement block, is expanded to 64 bytes and is addressed using a separate measurement-block address for each subchannel. The new measurement-block format provides additional measurement information and the flexibility to store the measurement blocks in non-contiguous, real storage.
The previously existing channel-measurement block is termed a format-0 channel-measurement block. A device-busy-time field is added to the format-0 channel-measurement block.
The text was updated successfully, but these errors were encountered:
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Support for the described architectural feature is currently missing and needs to be added.
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Nov 29, 2017
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(the original issue was moved into a different issue)
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Missing
Support for the described architectural feature is currently missing and needs to be added.
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Dec 18, 2017
Extended-I/O-Measurement-Block Facility (June, 2003)
The extended-I/O-measurement-block facility may be available on models implementing z/Architecture. The facility includes the following features:
A new format of the channel-measurement block. The new measurement block, termed a format-1 channel-measurement block, is expanded to 64 bytes and is addressed using a separate measurement-block address for each subchannel. The new measurement-block format provides additional measurement information and the flexibility to store the measurement blocks in non-contiguous, real storage.
The previously existing channel-measurement block is termed a format-0 channel-measurement block. A device-busy-time field is added to the format-0 channel-measurement block.
The text was updated successfully, but these errors were encountered: