From e3b3a44305df52503f91b55be61237aff8eff45d Mon Sep 17 00:00:00 2001 From: Kyle Westfall Date: Mon, 28 Aug 2023 09:26:13 -0700 Subject: [PATCH] doc hotfix --- doc/calibrations/slit_tracing.rst | 6 +++--- 1 file changed, 3 insertions(+), 3 deletions(-) diff --git a/doc/calibrations/slit_tracing.rst b/doc/calibrations/slit_tracing.rst index 6a75971ad8..9e444c8a35 100644 --- a/doc/calibrations/slit_tracing.rst +++ b/doc/calibrations/slit_tracing.rst @@ -207,7 +207,7 @@ Detection Threshold The detection threshold for identifying slits is set relatively low to err on the side of finding more as opposed to fewer slit edges. The algorithm can be fooled by scattered light and detector -defects. One can increase the threshold with the ``sigdetect`` +defects. One can increase the threshold with the ``edge_thresh`` parameter: .. code-block:: ini @@ -219,11 +219,11 @@ parameter: Then monitor the number of slits detected by the algorithm. Presently, we recommend that you err on the conservative -side regarding thresholds, i.e. higher values of ``sigdetect``, +side regarding thresholds, i.e. higher values of ``edge_thresh``, unless you have especially faint trace flat frames. On the flip side, if slit defects (common) are being -mistaken as slit edges then *increase* ``sigdetect`` +mistaken as slit edges then *increase* ``edge_thresh`` and hope for the best. .. _trace-slit-mask_frac_thresh: