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Merge pull request #251 from DeMarcoLab/v0.2-dev
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v0.2.4 Release
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patrickcleeve2 authored Sep 22, 2023
2 parents 246c449 + 9be50c8 commit 0605dd6
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1 change: 1 addition & 0 deletions .gitignore
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Expand Up @@ -55,3 +55,4 @@ scratch/tile-images/*
fibsem/log/*
fibsem/db/fibsem.db
fibsem/notebook.ipynb
scratch/health-monitor/*
4 changes: 4 additions & 0 deletions docs/started.md
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Expand Up @@ -5,6 +5,10 @@

Please see README.md

### Desktop Shortcut

To create a desktop shortcut for FibsemUI, simply run the shortcut.py file.

### System Configuration

The system configuration is defined by a system.yaml file. This defines various system settings, including connection details, beam, imaging, and stage settings.
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72 changes: 72 additions & 0 deletions external/application_files/autolamella.xml
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<Content Version="Fei ApplicationFile 1.1">

<!-- Application file for milling silicon (Si) without any gas for Xe PFIB -->


<!-- Client tag determines where file is displayed to user.
Can be XTUI, iFast or a combination separated by comma -->
<Client xmlns:dt="urn:schemas-microsoft-com:datatypes" dt:dt="string">
XTUI, iFast
</Client >


<!-- Beam, must be Electron or Ion -->
<Beam xmlns:dt="urn:schemas-microsoft-com:datatypes" dt:dt="string">
Ion
</Beam>


<!-- Pattern filter sets if file will be displayed for a given pattern type.
Can be set to Line, Circle, Rectangle, CCS, RCS, Bitmap, StreamFile, Polygon
Can be a combination separated by comma(s) -->
<PatternType xmlns:dt="urn:schemas-microsoft-com:datatypes" dt:dt="string">
Line, Circle, Rectangle, Bitmap, Streamfile, Polygon, CCS, RCS
</PatternType>


<!-- Gas type, must match name of gas in UI or empty for no gas -->
<GasType xmlns:dt="urn:schemas-microsoft-com:datatypes" dt:dt="string">
</GasType>


<!-- Dwell time per point, in seconds, minimum is 50e-9 (50ns), maximum is 4.5e-3 (4.5 ms) -->
<DwellTime xmlns:dt="urn:schemas-microsoft-com:datatypes" dt:dt="r8">
1.000E-6
</DwellTime>


<!-- Overlap between points as percentage of the spot diameter. Must be < 100%. -->
<Overlap xmlns:dt="urn:schemas-microsoft-com:datatypes" dt:dt="r8">
98
</Overlap>


<!-- Volume per Dose, the volume of material that is deposited or removed per dose of the beam in m^3/Coulomb.
1e-9 m^3/C = 1 um^3/nC. (Si) is 0.27 um^3/nc = 0.27e-9 m^3/C -->
<VolumePerDose xmlns:dt="urn:schemas-microsoft-com:datatypes" dt:dt="r8">
0.00000000038
</VolumePerDose>


<!-- Blur and Defocus.
Blur- the additional beam diameter that is caused by defocussing in m.
Note that the total beam diameter is the root of the sum of the
squared beam, interaction and blur diameters.
Defocus- Defocus the beam in m to longer or shorter working distance while patterning.
Positive values will set focus value to a longer working distance.
Negative values will set focus value to a shorter working distance.
Only use a Blur or a Defocus value. Do not use both.
If no value is to be set for patterning a Blur or Defocus must be set to a 0 -->
<Blur xmlns:dt="urn:schemas-microsoft-com:datatypes" dt:dt="r8">
0
</Blur>


<!-- Relative Interaction Diameter must always be set to 0. -->
<RelativeInteractionDiameter xmlns:dt="urn:schemas-microsoft-com:datatypes" dt:dt="r8">
0
</RelativeInteractionDiameter>

</Content>
16 changes: 16 additions & 0 deletions external/application_files/cryo_Pt_dep.xml
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<Content Version="Fei ApplicationFile 1.1" xmlns:dt="urn:schemas-microsoft-com:datatypes">
<PatternType dt:dt="string">Line</PatternType>
<Beam dt:dt="string">Electron</Beam>
<GasType dt:dt="string">Pt cryo</GasType>
<GasDutyCycle dt:dt="string">1:0.2</GasDutyCycle>
<GasNeedlePosition dt:dt="string">1:cryo</GasNeedlePosition>
<DwellTime dt:dt="r8">1E-07</DwellTime>
<Overlap dt:dt="r8">-90</Overlap>
<VolumePerDose dt:dt="r8">5E-11</VolumePerDose>
<SaturationSputterRate dt:dt="r8">0</SaturationSputterRate>
<RefreshTime dt:dt="r8">0</RefreshTime>
<Defocus dt:dt="r8">0</Defocus>
<InteractionDiameter dt:dt="r8">0</InteractionDiameter>
<MaximumDosePerArea dt:dt="r8">0</MaximumDosePerArea>
<SaturationCurrentDensity dt:dt="r8">1</SaturationCurrentDensity>
</Content>
7 changes: 6 additions & 1 deletion fibsem/config.py
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METADATA_VERSION = "v1"
METADATA_VERSION = "v2"

# sputtering rates, from microscope application files
MILLING_SPUTTER_RATE = {
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REFERENCE_HFW_SUPER = 80e-6
REFERENCE_HFW_ULTRA = 50e-6

REFERENCE_RES_SQUARE = [1024, 1024]
REFERENCE_RES_LOW = [768, 512]
REFERENCE_RES_MEDIUM = [1536, 1024]
REFERENCE_RES_HIGH = [3072, 2048]
REFERENCE_RES_SUPER = [6144, 4096]

MILL_HFW_THRESHOLD = 0.005 # 0.5% of the image

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11 changes: 10 additions & 1 deletion fibsem/config/protocol.yaml
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Expand Up @@ -121,5 +121,14 @@ patterns:
thickness: 2.0e-6
radius: 10.0e-6
depth: 1.0e-6

Trapezoid:
inner_width: 10.0e-6
outer_width: 20.0e-6
trench_height: 5.0e-6
depth: 1.0e-6
distance: 1.0e-6
n_rectangles: 10
overlap: 0.0
scan_direction: "ToptoBottom"
type: "Trapezoid"

1 change: 1 addition & 0 deletions fibsem/detection/detection.py
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Expand Up @@ -140,6 +140,7 @@ class LandingPost(Feature):

def detect(self, img: np.ndarray, mask: np.ndarray = None, point:Point=None) -> 'LandingPost':
self.px = detect_landing_post_v4(mask, point)
# self.px = detect_landing_post_v3(img, landing_pt=None)
return self.px


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