Accompanying Code for the paper "A Stochastic V2V LOS/NLOS Model Using Neural Networks for Hardware-In-The-Loop Testing", presented at VNC 2017 by Christina Stadler
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Christina Stadler, Xenia Flamm, Thomas Gruber, Anatoli Djanatliev, Reinhard German and David Eckhoff, "A Stochastic V2V LOS/NLOS Model Using Neural Networks for Hardware-In-The-Loop Testing," Proceedings of 9th IEEE Vehicular Networking Conference (VNC 2017), Torino, Italy, November 2017
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cs7org/neuralVNC17
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Christina Stadler, Xenia Flamm, Thomas Gruber, Anatoli Djanatliev, Reinhard German and David Eckhoff, "A Stochastic V2V LOS/NLOS Model Using Neural Networks for Hardware-In-The-Loop Testing," Proceedings of 9th IEEE Vehicular Networking Conference (VNC 2017), Torino, Italy, November 2017
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