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Temperature dependent ring oscillators, with different ratios of temperature to voltage dependencies

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TROS

This project for the tapeout via Tiny Tapeout aims at using ring oscillators to measure temperatures of the chip.

Introduction

This design implements three different ring oscillators. The first one is a basic NAND based oscillator. The second one adds additional NAND gates to the outputs of the stages of the oscillator to increase the capacitve loading. The last one uses the tri-state inverts with a sub-threshold tri-state enable. Each of the oscillators should have a different temperature and voltage dependency. Therefore it should be possible to measure the temperature (and supply voltage) with the help of a device specific calibration.

For measuring the frequencies each oscillator is driving a counter. This counters are latched with the latch counter input. With the input transfer counter the currently selected counter (counter select bits) is transfered via the serial data stream. The transfer is driven by the clock of the design. As encoding a manchester encoding is used.

Furthermore, a divided version of the clock of each oscillator is outputted. The divisior can be configured with the frequency selection bits.

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Temperature dependent ring oscillators, with different ratios of temperature to voltage dependencies

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